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6. OPERATING THE VARIOUS LADDER MONITOR SCREENS
6 - 18
MELSEC
GOT
6.2.4 Changing the device value
CAUTION
•
Read the manual carefully and fully understand the operation before the test
operation (ON/OFF of bit devices, modifying current value of a word device,
modifying timer/counter setting, modifying the current value, or modifying the
current value of a buffer memory) of ladder monitor.
In addition, never modify data in a test operation to a device, which performs a
crucial operation to the system.
It may cause an accident by a false output or malfunction.
Changing the device value on the screen during ladder monitoring is described.
Switches for the timer/counter value display format (decimal/hexadecimal), and the
comment display for the corresponding device (on/off) can be performed.
(1) Device value changing method
The device value changing method during ladder monitoring is described below:
List
Print
Screen
Cancel
Print
Exit MenuPLCRD. Mon.
1)
2
)
<Circuit monitor Screen>
Dev.Sea.
Cont.Sea.
Coil.Sea.
16/32BIT
10/16Dec.Hex
Test
Step.Sea.
End.Sea.
Fact.Sea. Cmnt.
Display the ladder monitor screen by touching
LADDER MON.
.
1) Display the screen shown in 2) by touching
Menu
.
2) Display the test window by touching
Test
.
3) As the test window will open, perform the operation by
seeing Sec. 9.6.
After the device change is complete, the changed contents
can be verified in the ladder monitor.
List
Print
Screen
Cancel
Print
I—¹
Menu
PC“ÇoÓÆÀ
SET/RST VALUE16
SET VAL VALUE32 BM VAL32
BM VAL16
NETWK NO.[ 0] STATION[FF]
3)
[When using A970GOT-STN TFT]
Print
Screen
Cancel
Print
I—¹
Menu
PC“ÇoÓÆÀ
SET/RST VALUE16
SET VAL VALUE32 BM VAL32
BM VAL16
NETWK NO.[ 0] STATION[FF]
3)
[When using A960GOT-EL]
List
The current value display of the word device becomes
hidden from view due to the test window.
Using the
key entries, the hidden current
value display can be displayed by scrolling to the
right/left.
NOTE