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[ OFFSET ] This test verifies that the analyzer can correct for dc offsets generated by the input circuits on
the A1 Input assembly or A2 Input assemblies. In this test, the input circuits are connected to
ground. For the A1 Input assembly’s channel 1, time record measurements are taken with the
signal routed through the 100 kHz anti-alias filter and through the 50 kHz anti-alias filter with
the dc offset DAC set to 127, then to –127. For the A1 Input assembly’s channel 2, time record
measurements are taken with the signal routed through the 50 kHz anti-alias filter with the dc
offset DAC set to 127, then to –127. For the A2 Input assembly’s channel 1 or 2, time record
measurements are taken with the signal routed through the 50 kHz anti-alias filter and through
the 25 kHz anti-alias filter with the dc offset DAC set to 127, then to –127. For the A2 Input
assembly’s channel 3 or 4, time record measurements are taken with the signal routed through
the 25 kHz anti-alias filter with the dc offset DAC set to 127, then to –127.
[ QUICK CONF TEST ] This test calibrates the analyzer and checks the calibration limits. Any calibration errors are
entered in the Test Log. See “Calibration Routine Description” earlier in this chapter for a
description of the calibration routine.
[ RANDOM SEEK ] This test verifies that the A100 Disk Drive assembly’s head can move to a random sector on the
flexible disk. In this test, the disk controller on the A7 CPU assembly instructs the disk-drive
head to move to a random record. This test requires a formatted flexible disk.
[ READ ] This test verifies that the A100 Disk Drive assembly can read a flexible disk. In this test, the
A7 CPU assembly’s disk controller instructs the Disk Drive assembly to read the current record
on the flexible disk. While the current record is being read, the disk controller monitors the
RDDATAn signal to verify the read operation. The current record is set by the [
SEEK RECORD
] test. This test requires a formatted flexible disk.
[ READ/WRITE ] This test verifies that the A100 Disk Drive assembly can read and write to a flexible disk. In
this test, the A7 CPU assembly’s disk controller instructs the Disk Drive assembly to read the
current record on the flexible disk. While the current record is being read, the disk controller
monitors the RDDATAn signal to verify the read operation. The disk controller then instructs
the Disk Drive assembly to write to the current record. While the current record is being
written to, the disk controller monitors the WDATAn signal to verify the write operation. The
current record is set by the [
SEEK SECTOR ] test. This test requires a formatted flexible disk that
is not write protected.
[ READ/WRITE ALL ] This test verifies that the A100 Disk Drive assembly can read and write to all records of a
flexible disk. In this test, the A7 CPU assembly’s disk controller instructs the Disk Drive
assembly to read every available record on the flexible disk (excluding privileged tracks).
While the flexible disk is being read, the disk controller monitors the RDDATAn signal to
verify the read operation. The disk controller then instructs the Disk Drive assembly to write to
every available record on the flexible disk (excluding privileged tracks). While the flexible
disk is being written to, the disk controller monitors the WDATAn signal to verify the write
operation. This test stops on the first error. The execution time for this test depends upon the
size of the disk. For example, if there are no errors, this test takes approximately one hour for a
double-sided, low-density disk. This test requires a formatted flexible disk that is not write
protected.
[ RESTORE ] This test verifies that the A100 Disk Drive assembly’s head can move away from track 0, then
back to track 0. In this test, the A7 CPU assembly’s disk controller instructs the disk-drive
head to move away from track 0, then back to track 0. The disk controller monitors the T00n
signal to verify the move operation. This test requires a formatted flexible disk.
Internal Test Descriptions Agilent 35670A
Self-Test Descriptions
10-16