Filter
Top Products
Functional Tests All Self-Test Group
Softkey Self Test Name
Assembly
A7 A8 A6
A12/
A22
A1 A2 A5 A10 A11 A100
[ INTERRUPT]
Interrupt
X0
[ MULTI FCTN PERIPHERL ]
†
Multi Fctn Peripheral
X0
[ FRONT PANEL ]
†
Front Panel
X0 X
[ GPIB FUNC TEST ]
GPIB
X0
[ DISK CONTROLLR ]
Disk Controller
X0
[ DISK FIFO ]
Disk FIFO
X0
[ IIC BUS ]
IIC Bus
X0 X XXXXX
[ FAST BUS ]
†
Fast Bus
X0X
[ TRIGGER ]
Trigger Gate Array
00X
[ LO ]
LO Gate Array
00X
[ DIGITAL FILTER ]
Digital Filter Gate Array
00X
[ FIFO ]
FIFO
00X
[ BASEBAND ]
Baseband
0 0X XXX
[ ZOOM ]
Zoom
0 0X XXX
[ DGTL SRCE THRU DSP ]
Source through DSP
00X
[ SOURCE LO ]
Source LO
00X
[ SOURCE TO CPU ]
Source to CPU
00X
[ WITHOUT LO ]
Source without LO
0 0X XXX
[ WITH LO ]
Source with LO
0 0X XXX
[ ADC GATE ARRAY ]
ADC Gate Array
000 X
[ OFFSET ]
Input Offset
000 XXX
[ DISTORTN ]
Input Distortion
000 XXX
[ INPUT TRIGGER ]
Input Trigger
000 XXX
[ INPUT A-WEIGHT ]
Input A-Wt Filter
000 XXX
[ AAF BYPASS ]
Input AAF/Bypass
000 XXX
[ INPUT ICP ]
Input ICP Source
000 XXX
[ TACHOMETR ]$!
C5,5,0,255,255,255
Tachometer
00X0 X
[ QUICK CONF TEST ]
Quick Confidence
000 XXX
X This assembly or sub-block is the most likely cause of the failure message. 0 This assembly or sub-block is used by the self test but is not the most likely cause of the
failure message. No symbol means that the assembly is not used by the self test.
† High-level power-on tests
The power supply and display are used in every test.
Agilent 35670A Internal Test Descriptions
Self-Test Descriptions
10-11