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Self-Test Descriptions
Thirty-seven self tests are available that can be run in groups or individually. The
following table lists the group of self tests that are run when you select
[
FUNCTIONL TESTS ], [ ALL ]. This group does not include any of the self tests that
require a formatted flexible disk. The table lists the assemblies used by each self test
and shows the assembly that would most likely cause the failure. To run these self
tests in the order shown, press the following keys:
[ System Utility ]
[ SELF TEST ]
[ FUNCTIONL TESTS ]
[ ALL ]
To run a single self test, press the softkey shown in the table instead of [ ALL ]. To
determine the key path for the self-test softkeys, see “Self-Test Menu Map and GPIB
Commands” starting on page 10-18.
Certain instrument malfunctions cause multiple self-test failures. Therefore, to
determine the most likely cause when more than one self test fails, look in the
‘’Functional Tests All Self-Test Group’’ table for assemblies common to all failing
self tests.
Internal Test Descriptions Agilent 35670A
Self-Test Descriptions
10-10