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Self Tests that Perform a Measurement
The following self tests perform measurements:
Self Test Front Panel Softkey
Baseband [ BASEBAND ]
Zoom [ ZOOM ]
Source thru DSP [ DGTL SRCE THRU DSP ]
ADC gate array [ ADC GATE ARRAY ]
Source to CPU [ SOURCE TO CPU ]
Source with LO [ WITH LO ]
Source Without LO [ WITHOUT LO ]
Input Offset [ OFFSET ]
Input Distortion [ DISTORTN ]
Input Trigger [ INPUT TRIGGER ]
Input A-Wt Filter [ INPUT A-WEIGHT ]
Input AAF/Bypass [ AAF BYPASS ]
Input ICP Source [ INPUT ICP ]
The measurements that these self tests perform are averaged measurements, with only
one trace per average. Some hardware setup modes used in these self tests are not
used by normal measurements and can not be accessed from the front panel.
The measurements bypass any standard corrections and do not perform calibration
data corrections. Therefore, all self-test measurements using analog data have limits
larger than the standard calibration tolerances.
Once the hardware is set up, data is taken and time records are processed according to
the needs of the specific test. Some tests monitor overloads, others require spectrum
data, and others require time record data. After the data is collected, it is compared to
an internal reference specification to determine if the self test passed or failed. The
pass or fail information along with any additional information is placed in the Test
Log.
Internal Test Descriptions Agilent 35670A
Self-Test Descriptions
10-12