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402 Index
Index
iDEN offset frequencies, 294, 295,
297, 310
iDEN trigger source, 316
identity, IEEE command
options, query
model number, query
, 188
IEEE common commands
*commands, IEEE
, 187
IF flatness adjustment, 217
IF trigger delay
, 395
IF trigger level
, 396
IF trigger slope, 396
image filter calibration
, 216
increasing measurement speed
,
67
initiate measurement
, 192, 247,
248
input attenuation, 331
INPut commands
, 249
input configuration
, 249
input port selection, 329
input power
maximum
, 332
range, 332
input/output
, 183
inputs
configuration
, 382
install application
, 281, 387
Install Now key
, 43
installing measurement
personalities
, 41
instrument
memory functions
, 281
instrument configuration
, 252
instrument firmware updates
, 43
instrument memory, 282
instrument preset
, 184, 190, 388
instrument states
programming example
, 139
instrument status
, 76, 365
monitoring
, 191
monitoring status monitoring,
191
integer variable
, 63
integrity condition register, 372,
373, 374
integrity signal condition register
,
374, 375
internal reference
, 345, 346
internal reference selection
, 329
internet location for information,
36
internet protocol address
, 382
invert display printout, 245
invert screen background
, 284
IP
, 184
IP address, 382
IP, instrument preset
, 388
IQ port selection
, 329
IS-95A, 343
IS-95B
, 343
IS-95C
, 343
J
Java program
, 104
Java program example
, 171
Java programing socket LAN
, 104
JSTD8, 343
K
keyboard lock-out
, 386
L
LAN
bus
, 55, 89
C program
, 104
C program example
, 148, 168
cable, 111
IP address
, 382
Java program
, 104
Java program example, 171
SICL
, 95
socket programming
, 94
telnet, 92
using
, 55, 89
VEE program
, 103
LAN defaults, 55, 106
LAN troubleshooting
, 105
landscape printing
, 243
language reference, 185
license key
, 387
license key ID
, 386
limit line testing, 195
limit testing
ACP
, 194, 293, 294
NADC, 194
PDC
, 194
linking C C with VTL
, 114
listener, 122
loading
modes/application
, 281
loading an
application/personality
, 41
local echo, lack of
, 93
lock-out
front panel
, 386
LRN, IEEE command
, 188
M
M16QAM
, 343
M64QAM
, 343
making measurements
, 255
making reasurements
CONFigure commands
, 256
FETCh commands
, 257
MEASure commands, 255
READ commands
, 257
markers
, 183, 201
assigning them to traces, 207
bandpower
, 204
maximum
, 205
minimum, 206
noise
, 204
off
, 204, 207
programming example, 129
trace assignment
, 211
turn off
, 204
type, 206
valid measurement
, 201
value
, 212
value of, 205
x-axis location
, 211
y-axis
, 212
mass storage
selecting
, 282
mass storage commands
, 282
maximum value of trace data,
196, 200
mean value of trace data
, 196, 200
MEASure command use, 255
MEASure commands
, 255
measurement
adjacent channel power
, 286
adjacent channel power ratio
,
286
channel power, 324
commands used
, 182
controlling commands
, 183
making, 183
markers
, 201
mode setup
, 183
power statistics CCDF
measurement
, 333
power vs. time
, 335
programming example, 145
query current
, 227
selecting modes
, 183
setting it up, 183
spectrum (frequency domain)
,
346
waveform (time domain), 357
measurement modes
currently available
, 252
selecting, 252, 253
measurement speed, increasing
,
67
measurements
adjacent channel power ratio
,
259
bottom/middle/top, 69