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Appendix B: Automatic Measurements Reference
CSA8000B & TDS8000B User Manual
B-23
Table B- 4: RZ Measurements - Amplitude (cont.)
Name Definition
RZ Peak-to-Peak Noi se The maximum range of the data distribution sampled within a fixed wi dth verti cal slice located at
the center of the Eye Aperture at the High or Low levels. See RZ Eye Aperture Parameters
on B--62.
PkPk noise = Highpp or PkPk noise = Lowpp
The Eye Aperture is adj ustable and defaults to 5% of the RZ pulse width. The High or Low
selection for Noise At control in the Measurement Setup dialog specifies that the measurement
is to be perform ed on the logical 1 or 0 levels.
If enabled, measurement gates constrain the measurement region to the area between the Start
Gate (G1) and Stop Gate (G2).
This measurement requires the use of a waveform database. When this measurement is turned
on, it will automat ically set the measurement system to use a waveform database if available.
For best result s with t his measurement:
H Perform a Dark Level compensati on before taki ng this m easurement if the source of the
measured waveform is an optical channel. See To Perform Dark-Level and User
Wavelength Gain Compensations on page 3--98.
H Perform Autoset or otherwise optimize the vertical resolution before this measurement, i.e.,
increase the overall verti cal size of t he wavef orm (but wit hout producing off-screen
waveform points). See How to Optimize the Vertical Resolution on page B--70.