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Chapter 15 183
TD-SCDMA Measurement Application
Measurements
Description Specification Supplemental Information
Spectrum Emission Mask
Dynamic Range, relative
815 kHz offset
ab
a. The dynamic range specification is the ratio of the channel power to the power in the offset specified.
The dynamic range depends on the measurement settings, such as peak power or integrated power.
Dynamic range specifications are based on default measurement settings, with detector set to average,
and depend on the mixer level. Default measurement settings include 30 kHz RBW.
b. This dynamic range specification applies for the optimum mixer level, which is about −17 dBm. Mixer
level is defined to be the average input power minus the input attenuation.
74.3 dB
81.3 dB (typical)
Sensitivity, absolute
815 kHz offset
c
c. The sensitivity is specified with 0 dB input attenuation. It represents the noise limitations of the ana-
lyzer. It is tested without an input signal. The sensitivity at this offset is specified in the default 30 kHz
RBW, at a center frequency of 2 GHz.
-94.7 dBm
-100.7 dBm (typical)
Accuracy
815 kHz offset
Relative
d
d. The relative accuracy is a measure of the ratio of the power at the offset to the main channel power. It
applies for spectrum emission levels in the offsets that are well above the dynamic range limitation.
±0.11 dB
Absolute
e
20 to 30° C
e. The absolute accuracy of SEM measurement is the same as the absolute accuracy of the spectrum ana-
lyzer.
±1.05 dB ±0.31 dB (95% confidence)