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Chapter 13 165
cdma2000 Measurement Application
Measurements
Description Specifications Supplemental Information
Spectrum Emission Mask
a
a. SEM test items compliance the limits of conducted spurious emission specification defined in 3GPP2
standards
Dynamic Range, relative
750 kHz offset 73.6 dB 81.0 dB (typical)
1980 kHz offset 78.3 dB 83.9 dB (typical)
Sensitivity, absolute
b
b. The sensitivity is specified with 0 dB input attenuation. It represents the noise limitations of the ana-
lyzer. It is tested without an input signal. The sensitivity at this offset is specified for the default 30 kHz
RBW, at a center frequency of 2 GHz
750 kHz offset −94.7 dBm −100.7 dBm (typical)
1980 kHz offset −94.7 dBm −100.7 dBm (typical)
Accuracy
750 kHz offset
Relative
c
c. The relative accuracy is a measure of the ration of the power at the offset to the main channel power. It
applies for spectrum emission levels in the offsets that are near the regulatory limits of –25 dBc at
750 kHz offset and –60 dBc at 1980 kHz offset.
±0.09 dB
Absolute
d
20 - 30 °C
d. The absolute accuracy of SEM measurement is the same as the absolute accuracy of the spectrum ana-
lyzer. See Absolute Amplitude Accuracy for more information. The numbers shown are for 0 -
3.6 GHz, with attenuation set to 10 dB.
±1.05 dB
±0.31 dB (at 95% confidence)
1980 kHz offset
Relative
c
±0.10 dB
Absolute
d
20 - 30 °C ±1.05 dB
±0.31 dB (at 95% confidence)