Agilent Technologies Agilent 35670A Stereo System User Manual


 
AGILENT 35670A
Supplemental Operator’s Guide
31
Changing Frequency Span
Changing frequency span or resolution affects three important parameters in hammer
testing which must be changed to correspond to the new time record length: Trigger
Delay, Force Window Width, and Response Window Decay Time. The following
relationship between the parameters can be used as a guideline:
()
T
N
F
=
1024.
Where T is the time record length in seconds, N is the resolution in lines, and F is the
frequency span in Hz.
Delay T= 01.( )
ForceWidth
T
=
7
ExponentialDecay
T
=
4
When the frequency span is halved, the Time Record length doubles, as does the
Delay time, Force Width, and Exponential Decay. All three parameters should
change with the inverse of the change in frequency span.