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174
Index
G
G.821 analysis measurement, 71
G.826 analysis measurement, 71
Graphics
copyresults frominstrumentto disk,150
logging displays, 105
recall results from disk, 145
recall stored results, 99
saving results to disk, 140
saving to instrument, 98
storage resolution, 98
viewing error & alarm summaries, 103
viewing the bar graphs, 101
H
H4 byte
sequence setting, 23
HP path label monitoring, 25
HP-IB printer, 117
I
Insert
DCC, 65
external payload/test signal, 43
Internal printer
change paper, 122
logging, 118
print head cleaning, 125
J
J1, J2 bytes
setting, 23
Jitter
measurement, 84, 86
receive interface, 18, 19
transmit interface, 7
Jitter tolerance
delay time, 90
dwell time, 90
error threshold, 90
graph result, 91
logging results, 112
measurement, 89
number of points, 90
text result, 91
Jitter transfer
accuracy, 92
calibration, 93
delay time, 94
dwell time, 94
graph results, 96
input mask, 94
logging results, 114
measurement, 92
number of points, 94
Q factor, 94
K
Keyboard lock, 156
L
Labeling a disk, 132
Labels, overhead monitoring, 25
Line overhead
insertion, 27
Lock keyboard, 156
Logging
content, 108
control, 108
device, 109, 110
error event, 107
graph displays, 105
jitter tolerance results, 112
jitter transfer results, 114
on Demand, 110
Overhead Capture, 110
overhead snapshot, 110
Pointer Graph, 110
result logged, 108
results, 107
results snapshot, 110
selftest failures, 110
SONET Tributary Scan, 110
test period, 107
to Centronics printer, 116
to disk, 142
to HP-IB printer, 117
to internal printer, 118
to RS-232-C printer, 119
when, 108
LOH
insertion, 27
M
M2100 analysis measurement, 71
M2110 analysis measurement, 71
M2120 analysis measurement, 71
Managing
disk directories, 133
disk files, 133
Measuring
DSn analysis, 71
extended jitter, 86
frequency, 72
jitter, 84
jitter tolerance, 89
jitter transfer, 92
optical power, 73
overhead BER, 68
round trip delay, 74
service disruption, 77
SONET analysis, 70
wander, 87
Monitor
equalizer, 15
indicator, 15
receive overhead, 24
MSP messages
generation, 64
monitoring, 25
test function, 64
O
Optical
clock stress, 63
power measurement, 73
Overhead
all labels, 23
APS messages monitoring, 25
BER test, 68
capture, 29
default transmit, 22
H4 byte sequences, 23
Labels monitoring, 25
monitor receive, 24
path monitor, 25
path transmit, 23
sequence generation, 27
TOH transmit, 23
trace messages, 26
transmit, 22
Overhead capture
trigger, 29
Overhead capture test function, 29