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SE-DIR800C
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8
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A
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E
No. Pin Name I/O Function
151 SCLK I Clock input of CPU interface data
152 XLAT I Latch input of CPU interface data
153 SWDT
I
Writing input of CPU interface data
154 TEST74 O Test pin, normally open-circuit
155 TEST75 I Test pin, normally fixed to L
156 TEST76 O Test pin, normally open-circuit
157 TEST77 O Test pin, normally open-circuit
158 TEST78 O Test pin, normally open-circuit
159 TEST79 O Test pin, normally open-circuit
160 VSS − Digital GND
161 TEST80 O Test pin, normally open-circuit
162 TEST81 O Test pin, normally open-circuit
163 TEST82 O Test pin, normally open-circuit
164 TEST83 O Test pin, normally open-circuit
165 VDD − Digital power supply
166 TEST84 O Test pin, normally open-circuit
167 TEST85
I
Test pin, normally fixed to L
168 TEST86 I Test pin, normally fixed to L
169 TEST87
O
Test pin, normally open-circuit
170 TEST88 O Test pin, normally open-circuit
171 VSS − Digital GND
172 TEST89
O
Test pin, normally open-circuit
173 TEST90 O Test pin, normally open-circuit
174 TEST91 O Test pin, normally open-circuit
175 TEST92 I Test pin, normally fixed to L
176 TEST93
O
Test pin, normally open-circuit