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SE-DIR800C
44
1234
1234
C
D
F
A
B
E
Pin Function
No. Pin Name I/O Function
1 VSS − Digital GND
2NC − Non connection
3NC
−
Non connection
4 DAAVD − Analog power supply for RF DAC
5 DAAOUT O RF DAC output
6 DAAVS − Analog GND for RF DAC
7 DAVRO I/O Internal current setting for RF DAC
8 DAVREF I Reference voltage input for RF DAC
9NC − Non connection
10 ADAVS − Analog GND for RF ADC
11 ADVRH I Reference voltage input for RF DAC (high)
12 ADAVD − Analog power supply for RF DAC
13 ADVRL I Reference voltage input for RF DAC (low)
14 ADVIN I RF ADC input
15 TEST1 I Test pin, normally fixed to L
16 TEST2 I Test pin, normally fixed to L
17 VSS
−
Digital GND
18 TEST3 I Test pin, normally fixed to L
19 TEST4
O
Test pin, normally open-circuit
20 TEST5 I Test pin, normally fixed to L
21 TEST6 I Test pin, normally fixed to L
22 TEST7
I
Test pin, normally fixed to L
23 TEST8 I/O Test pin, normally open-circuit
24 TEST9 I/O Test pin, normally open-circuit
25 TEST10 I/O Test pin, normally open-circuit
26 TEST11
I/O
Test pin, normally open-circuit
27 TEST12 I/O Test pin, normally open-circuit
28 VSS − Digital GND
29 TEST13 I/O Test pin, normally open-circuit
30 TEST14 I/O Test pin, normally open-circuit
31 TEST15 I/O Test pin, normally open-circuit
32 TEST16 I Test pin, normally fixed to L
33 VDD − Digital power supply
34 TEST17 O Test pin, normally open-circuit
35 TEST18 O Test pin, normally open-circuit
36 TEST19 O Test pin, normally open-circuit
37 TEST20 O Test pin, normally open-circuit
38 TEST21
I
Test pin, normally fixed to L
39 VSS
−
Digital GND
40 TEST22 I Test pin, normally fixed to L
41 TEST23 I Test pin, normally fixed to L
42 TEST24 I Test pin, normally fixed to L
43 TEST25 I Test pin, normally fixed to L
44 TEST26 I Test pin, normally fixed to L
45 TEST27 I Test pin, normally fixed to L
46 TEST28 I Test pin, normally fixed to L
47 TEST29 O Test pin, normally open-circuit
48 TEST30 O Test pin, normally open-circuit
49 TEST31 O Test pin, normally open-circuit
50 VSS
−
Digital GND