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Philips Semiconductors
SA5211
Transimpedance amplifier (180 MHz)
Product specification Rev. 03 — 07 October 1998 9 of 28
9397 750 07427
© Philips Electronics N.V. 2001. All rights reserved.
Fig 6. Test circuit 8.
GND
2
Test Circuit 8
OUT +
OUT –
GND
1
IN
DUT
I
IN
(µA)
5V
V
OUT
(V)
+
–
Typical Differential Output Voltage
vs Current Input
2.00
1.60
1.20
0.80
0.40
0.00
–0.40
–0.80
–1.20
–1.60
–2.00
–100 –80 –60 –40 –20 0 20 40 60 80 100
DIFFERENTIAL OUTPUT VOLTAGE (V)
CURRENT INPUT (µA)
NE5211 TEST CONDITIONS
Procedure 1 R
T
measured at 15µA
R
T
= (V
O1
– V
O2
)/(+15µA – (–15µA))
Where: V
O1
Measured at I
IN
= +15µA
V
O2
Measured at I
IN
= –15µA
Procedure 2 Linearity = 1 – ABS((V
OA
– V
OB
) / (V
O3
– V
O4
))
Where: V
O3
Measured at I
IN
= +30µA
V
O4
Measured at I
IN
= –30µA
Procedure 3 V
OMAX
= V
O7
– V
O8
Where: V
O7
Measured at I
IN
= +65µA
V
O8
Measured at I
IN
= –65µA
Procedure 4 I
IN
Test Pass Conditions:
V
O7
– V
O5
> 20mV and V
06
– V
O5
> 50mV
Where: V
O5
Measured at I
IN
= +40µA
V
O6
Measured at I
IN
= –400µA
V
O7
Measured at I
IN
= +65µA
V
O8
Measured at I
IN
= –65µA
SD00331
V
OB
= R
T
× (– 30 µA) + V
OB
V
OA
= R
T
× (+ 30 µA) + V
OB