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Philips Semiconductors
SA5211
Transimpedance amplifier (180 MHz)
Product specification Rev. 03 — 07 October 1998 3 of 28
9397 750 07427
© Philips Electronics N.V. 2001. All rights reserved.
7. Static characteristics
[1] Test condition: output quiescent voltage variation is less than 100 mV for 3 mA load current.
8. Dynamic characteristics
Table 3: Recommended operating conditions
Symbol Parameter Conditions Min Max Unit
V
CC
supply voltage 4.5 5.5 V
T
amb
ambient temperature range -40 +85 °C
T
J
junction temperature range -40 +105 °C
Table 4: DC electrical characteristics
Min and Max limits apply over operating temperature range at V
CC
= 5 V, unless otherwise specified. Typical data apply at
V
CC
= 5 V and T
amb
=25
°
C.
Symbol Parameter Test conditions Min Typ Max Unit
V
IN
input bias voltage 0.55 0.8 1.00 V
V
O±
output bias voltage 2.7 3.4 3.7 V
V
OS
output offset voltage − 0 130 mV
I
CC
supply current 20 26 31 mA
I
OMAX
output sink/source current
[1]
34− mA
I
IN
input current
(2% linearity)
Test Circuit 8,
Procedure 2
±20 ±40 −µA
I
IN MAX
maximum input current
overload threshold
Test Circuit 8,
Procedure 4
±30 ±60 −µA
Table 5: AC electrical characteristics
Typical data and Min and Max limits apply at V
CC
= 5 V and T
amb
=25
°
C
Symbol Parameter Test conditions Min Typ Max Unit
R
T
transresistance (differential output) DC tested RL = ∞
Test Circuit 8, Procedure 1
21 28 36 kΩ
R
O
output resistance (differential output) DC tested − 30 −Ω
R
T
transresistance (single-ended output) DC tested
RL = ∞
10.5 14 18.0 kΩ
R
O
output resistance (single-ended output) DC tested − 15 −Ω
f
3dB
bandwidth (-3dB) T
A
= 25°C
Test circuit 1
− 180 − MHz
R
IN
input resistance − 200 −Ω
C
IN
input capacitance − 4 − pF
∆R/∆V transresistance power supply sensitivity V
CC
= 5±0.5 V − 3.7 − %/V
∆R/∆T transresistance ambient temperature sensitivity ∆T
amb
= T
amb MAX
-T
amb MIN
− 0.025 − %/°C
I
N
RMS noise current spectral density (referred to
input)
Test Circuit 2
f = 10 MHz
TA = 25 °C
− 1.8 − pA/√Hz
I
T
integrated RMS noise current over the
bandwidth (referred to input)
TA = 25 °C
Test Circuit 2
−−−−