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Over twenty five years of manufacturing, research and engineering have led KIMBER KABLE
to explore in great detail the physical and electrical properties that influence signals and the
correlation to sensory quality. Through our OSCaR™ (objective Subjective, Correlation and
Results) engineering process KIMBER KABLE has developed many new proprietary proce-
dures for testing, engineering, manufacturing and evaluating cable. This process has allowed
us to make the vital link between scientific measurements and listening impressions.
The following precision laboratory test instruments are
owned and operated in-house by KIMBER KABLE:
Yokogawa PZ4000 Power Analyzer
Klippel Analyzer System w/all modules and
Laser Displacement meter
JTF Analysis System (Similar to HP 3587
except with higher 96/24 resolution)
Agilent 54624A 2 Mb Memory Mega Zoom
Oscilloscope
CLIO Electro-Acoustic Analyzer
HP 4194A Impedance/Gain-Phase Analyzer
HP 4284A Precision LCR Meter
HP 4395A Network/Spectrum Impedance
Analyzer
HP 87511A 500 MHz S-Parameter Test Set
HP 33120A Function/Arbitrary Waveform
Generator
HP 3458A Digital Multimeter
HP 1141A & 1142A 200 MHz Differential
Probe and Control Module
HP 4338B Milliohmmeter
HP 54616C 500 MHz Color Oscilloscope
Rhode & Schwartz Audio Analyzer
UPD-05.1030
Other in-house test systems and components include:
LEAP, MLSSA, Linear X, TEF 20 Spatial Analyzer &
TEF Pad, HP3325B, Tektronix 4284A Oscilloscope,
Tektronix 2247A Oscilloscope/Counter Timer, Tektronix
CFG280 Function Generator, Tektronix TDS3012 Color
Oscilloscope, Tektronix 2201, Brüel & Kjær 4007, ACO
4012, IVIE IE-30 Audio Analyzer, Spellman SL150 High
Voltage Power Supply, Audio Control Industrial SA-
3050A Third Octave RTA, S.C.V. PC 80 Phase Checker,
Sencore PR 57, Sencore LC53, Leader LCR-740,
Morrell MI-10, Meiji EMZ-TR Microscope.
For production testing and quality assurance we use the
following basic parameters:
Rdc: (resistance) basic dc resistance.
X: (reactance) ac resistance due to the capacitance
and inductance of the cable; a frequency
dependent property.
Xc: capacitive reactance.
Xl: inductive reactance.
Z: (impedance) total electrical opposition due to
both ac reactance and dc resistance; a
frequency dependent property.
Cp:
C: ability to store energy in electrostatic fields.
Cp: parallel aspect of capacitance.
Ls:
L: ability to store energy in magnetic fields.
Ls: series inductance.
Gain / Phase testing:
Gain (the increase or loss of signal) and
Phase test for the cables variances caused by
the C, L, R and other numerous properties of
the cable system.
Crosstalk testing:
Conductors were separated at the amplifier
end.
These test parameters are used for production testing
and in-house comparisons. Other extensive tests such
as: RF broad band tests, T/R gain/phase, R/T-GAMA,
R/T-THETA, S-PARAMETERS, etc. are used in
research diagnostics. Our research diagnostics further
includes listening evaluation. Correlations between
sensory and electrical measurements are proprietary.
Tests & Measurements