Analog Devices 82-003536-01 Stereo System User Manual


 
Evaluation Tools
2-54 Getting Started With SHARC Processors
The Blackfin/SHARC USB EZ-Extender daughter board features:
USB 2.0 interface – PLX Technology NET2272 device
USB driver and application code
CE certified
JTAG Emulators
JTAG (Joint Test Action Group) is defined by the IEEE 1149.1 standard
for a test access port for testing electronic devices. This standard defines a
method for serially scanning the I/O status of each pin on the device as
well as controlling internal operation of the device.
Boundary-scan testing was developed in the mid 1980s as the JTAG inter-
face to solve physical access problems on PCBs caused by increasingly
crowded assemblies due to novel packaging technologies. Boundary-scan
embeds test circuitry at chip level to form a complete board-level test pro-
tocol. With boundary-scan—industry standard IEEE 1149.1 since
1990—you can access the most complex assemblies for testing, debugging,
in-system device programming, and diagnosing hardware problems.
SHARC processors are equipped with a JTAG port and thus support the
IEEE 1149.1 standard for system test.
Through the JTAG port, you can run and halt the processor remotely.
The internal and external processor memory can be read or written, and
breakpoints can be set.
Most development boards include some built-in JTAG emulation cir-
cuitry. Your own hardware, most likely, does not contain this circuitry.